Systematic Characterization of Dual Probes for Electromagnetic Near-Field Measurement

被引：20

作者：

Shao, Weiheng ^{[1
]}

Tian, Xinxin ^{[2
]}

Chen, Rongquan ^{[1
]}

He, Xiao ^{[1
]}

Fang, Wenxiao ^{[1
]}

Lai, Ping ^{[1
]}

Lu, Guoguang ^{[1
]}

Guo, Yuandong ^{[3
]}

Wang, Lei ^{[1
]}

Huang, Yun ^{[1
]}

En, Yunfei ^{[1
]}

Shi, Yunlei ^{[1
]}

机构：

[1] China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

[2] Guangdong Univ Technol, Sch Phys & Optoelect Engn, Guangzhou 510006, Peoples R China

[3] Missouri Univ Sci & Technol, EMC Lab, Rolla, MO 65401 USA

来源：

IEEE SENSORS JOURNAL | 2021年 / 21卷 / 04期

基金：

中国国家自然科学基金;

关键词：

Probes; Microstrip; Detectors; Electromagnetics; Transmission line measurements; Systematics; Frequency response; Dual probe; near-fields measurement; frequency response; spatial resolution; isolation; electromagnetic interference (EMI);

D O I：

10.1109/JSEN.2020.3034255

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, systematic characterization of the dual probe, which is designed for the near field simultaneous measurement of both electric and magnetic field, is investigated with a microstrip line as the device under test (DUT). The characterization includes frequency response, transmission performance, symmetry, reflection, the intrusion of probe to the DUT, isolation of electric and magnetic field responses, field profile and spatial resolution, and differential electric field suppression. The dual probes with different design are adopted to demonstrate the systematic characterization.

引用

页码：4713 / 4722

页数：10

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