Effect of reflections on phase hologram recording in amorphous As-S-Se films

被引：0
|
作者：
Ozols, A [1 ]
Reinfelde, M
Teteris, J
机构：
[1] Riga Tech Univ, Inst Tech Phys, LV-1048 Riga, Latvia
[2] Latvian State Univ, Inst Solid State Phys, LV-1063 Riga, Latvia
来源：
RADIATION EFFECTS AND DEFECTS IN SOLIDS | 2002年 / 157卷 / 6-12期
关键词：
Fabry-Perot resonator effect; photoinduced processes; holography;
D O I：
10.1080/10420150215762
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
Experimental and theoretical studies of phase hologram recording in amorphous As-S-Se films with slightly wedge-shaped thickness profile are presented. It is shown that Fabry-Perot resonator effect caused by the interference of multiply reflected light beams inside the sample strongly changes the values of diffraction efficiency and its growth rate as well as the exposure time dependences of diffraction efficiency and transmissivity making them site-dependent and sample-dependent. Absorptivity and recording light intensity inside the sample are also significantly changed. The obtained results can be used to explain the holographic and optical experiments also in other materials with Fabry-Perot resonator effect such as other transparent thin films and photorefractive crystals.
引用
收藏
页码：1167 / 1171
页数：5
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