Atomic force microscopy to detect internal live processes in insects

Here we report on the use of atomic force microscopy (AFM) to study surface oscillations coming from internal live processes of insects. With a specially designed AFM stage to keep an insect motion partially restricted, the AFM can record internal oscillations on different parts of the insect. We demonstrate the method for a fly, mosquito, and lady beetle. We show that AFM can provide information about the spectral behavior that has not been studied so far, 10-600 Hz range, detecting amplitudes down to subnanometer level.