Semi-analytic modeling of chiral metasurface stacks

被引：0
|
作者：
Sperrhake, Jan [1 ]
Decker, Manuel [1 ]
Falkner, Matthias [1 ]
Fasold, Stefan [1 ]
Kaiser, Thomas [1 ]
Staude, Isabelle [1 ]
Pertsch, Thomas [1 ,2 ]
机构：
[1] Friedrich Schiller Univ Jena, Abbe Ctr Photon, Inst Appl Phys, Albert Einstein Str 15, D-07745 Jena, Germany
[2] Fraunhofer Inst Appl Opt & Precis Engn, Albert Einstein Str 7, D-07745 Jena, Germany
来源：
2019 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC) | 2019年
关键词：
D O I：
10.1109/cleoe-eqec.2019.8871913
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：1
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