Objective: Each Unified Medical Language System (UMLS) concept is assigned one or more semantic types (ST). A dynamic methodology for aiding an auditor in finding concepts that are missing the assignment of a given ST, S is presented. Design: The first part of the methodology exploits the previously introduced Refined Semantic Network and accompanying refined semantic types (RST) to help narrow the search space for offending concepts. The auditing is focused in a neighborhood surrounding the extent of an RST, T (of S) called an envelope, consisting of parents and children of concepts in the extent. The audit moves outward as long as missing assignments are discovered. In the second part, concepts not reached previously are processed and reassigned T as needed during the processing of S's other RSTs. The set of such concepts is expanded in a similar way to that in the first part. Measurements: The number of errors discovered is reported. To measure the methodology's efficiency, "error hit rates" (i.e., errors found in concepts examined) are computed. Results: The methodology was applied to three STs: Experimental Model of Disease (EMD), Environmental Effect of Humans, and Governmental or Regulatory Activity. The EMD experienced the most drastic change. For its RST "EMD boolean AND Neoplastic Process" (RST "EMD") with only 33 (31) original concepts, 915 (134) concepts were found by the first (second) part to be missing the EMD assignment. Changes to the other two STs were smaller. Conclusion: The results show that the proposed auditing methodology can help to effectively and efficiently identify concepts lacking the assignment of a particular semantic type.
机构:
New Jersey Inst Technol, Newark, NJ 07102 USA
CUNY, Borough Manhattan Community Coll, New York, NY 10007 USANew Jersey Inst Technol, Newark, NJ 07102 USA
Chen, Yan
Gu, Huanying
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Univ Med & Dent New Jersey, Newark, NJ 07107 USANew Jersey Inst Technol, Newark, NJ 07102 USA
Gu, Huanying
Perl, Yehoshua
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New Jersey Inst Technol, Newark, NJ 07102 USANew Jersey Inst Technol, Newark, NJ 07102 USA
Perl, Yehoshua
Geller, James
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New Jersey Inst Technol, Newark, NJ 07102 USANew Jersey Inst Technol, Newark, NJ 07102 USA
Geller, James
Halper, Michael
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Kean Univ, Union, NJ 07083 USANew Jersey Inst Technol, Newark, NJ 07102 USA
机构:
New York Inst Technol, Dept Comp Sci, New York, NY 10023 USANew York Inst Technol, Dept Comp Sci, New York, NY 10023 USA
Gu, Huanying
He, Zhe
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Florida State Univ, Sch Informat, Tallahassee, FL 32306 USANew York Inst Technol, Dept Comp Sci, New York, NY 10023 USA
He, Zhe
Wei, Duo
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Stockton Univ, Comp Sci & Informat Syst, Galloway, NJ USANew York Inst Technol, Dept Comp Sci, New York, NY 10023 USA
Wei, Duo
Elhanan, Gai
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New Jersey Inst Technol, Dept Comp Sci, Newark, NJ 07102 USA
Desert Res Inst, Reno, NV USANew York Inst Technol, Dept Comp Sci, New York, NY 10023 USA
Elhanan, Gai
Chen, Yan
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机构:
CUNY, Dept Comp Informat Syst, Borough Manhattan Community Coll, New York, NY 10021 USANew York Inst Technol, Dept Comp Sci, New York, NY 10023 USA
机构:
New York Inst Technol, Dept Comp Sci, 1855 Broadway, New York, NY 10023 USANew York Inst Technol, Dept Comp Sci, 1855 Broadway, New York, NY 10023 USA
Gu, H.
Chen, Y.
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CUNY, BMCC, Comp Informat Syst Dept, New York, NY 10021 USANew York Inst Technol, Dept Comp Sci, 1855 Broadway, New York, NY 10023 USA
Chen, Y.
He, Z.
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Columbia Univ, Biomed Informat Dept, New York, NY USANew York Inst Technol, Dept Comp Sci, 1855 Broadway, New York, NY 10023 USA
He, Z.
Halper, M.
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New Jersey Inst Technol, Dept Informat Technol, Newark, NJ 07102 USANew York Inst Technol, Dept Comp Sci, 1855 Broadway, New York, NY 10023 USA
Halper, M.
Chen, L.
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CUNY, BMCC, Dept Sci, New York, NY 10021 USANew York Inst Technol, Dept Comp Sci, 1855 Broadway, New York, NY 10023 USA