Ultrafast x-ray diffraction using a streak-camera detector in averaging mode

被引：62
|
作者：
Larsson, J
Chang, Z
Judd, E
Schuck, PJ
Falcone, RW
Heimann, PA
Padmore, HA
Kapteyn, HC
Bucksbaum, PH
Murnane, MM
Lee, RW
Machacek, A
Wark, JS
Liu, X
Shan, B
机构：
[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,ADV LIGHT SOURCE ACCELERATOR & FUS RES DIV,BERKELEY,CA 94720
[2] UNIV MICHIGAN,CTR ULTRAFAST OPT SCI,ANN ARBOR,MI 48109
[3] LAWRENCE LIVERMORE NATL LAB,LIVERMORE,CA 94551
[4] UNIV OXFORD,DEPT PHYS,CLARENDON LAB,OXFORD OX1 3PU,ENGLAND
[5] XIAN INST OPT & PRECIS MECH,XIAN 710000,PEOPLES R CHINA
来源：
OPTICS LETTERS | 1997年 / 22卷 / 13期
关键词：
D O I：
10.1364/OL.22.001012
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We demonstrate an apparatus for measuring time-dependent x-ray diffraction. X-ray pulses from a synchrotron are diffracted by a pair of Si(111) crystals and detected with an x-ray streak camera that has single-shot resolution of better than 1 ps. The streak camera is driven by a photoconductive su itch, which is triggered by 100-fs laser pulses at a repetition rate of 1 kHz. The laser and the streak camera are synchronized with the synchrotron pulses. In the averaging mode, trigger jitter results in 2-ps temporal resolution. We measured the duration of 5-keV pulses from the Advanced Light Source synchrotron to be 70 ps. (C) 1997 Optical Society of America.
引用
收藏
页码：1012 / 1014
页数：3
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