A review of FT-IR diffuse reflection sampling considerations

被引:64
|
作者
Milosevic, M [1 ]
Berets, SL [1 ]
机构
[1] Harrick Sci Corp, Ossining, NY 10562 USA
关键词
D O I
10.1081/ASR-120016081
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Diffuse reflectance is widely used for examining rough surfaced materials, samples abraded Oil substrates, powder, and reactions on powders, A variety of sampling methods are used for diffuse reflectance analysis. It is important to understand the theoretical constraints to correctly interpret the data for qualitative or quantitative applications. This article reviews the most commonly used theory of diffuse reflectance and discusses its limitations relative to the various sample handling methods used and the commercially available diffuse reflectance accessories.
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页码:347 / 364
页数:18
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