PMSE 319-Temperature-dependent thickness of polyelectrolyte multilayer thin films measured with phase-modulated ellipsometry

被引：0
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作者：
Walhout, Peter K. [1 ]
Khalil, Andrew M. [1 ]
Bartels, Joshua M. [1 ]
机构：
[1] Wheaton Coll, Dept Chem, Wheaton, IL 60187 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2008年 / 236卷
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
319-PMSE
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页数：1
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