Dependability analysis using multiple-valued decision diagrams

被引：0
|
作者：
Xing, LD [1 ]
Dugan, JB [1 ]
机构：
[1] Univ Virginia, Dept Elect & Comp Engn, Charlottesville, VA 22903 USA
来源：
PROBABILISTIC SAFETY ASSESSMENT AND MANAGEMENT, VOL I AND II, PROCEEDINGS | 2002年
关键词：
multiple-valued decision diagrams (MDDs); fault trees; imperfect coverage modeling (IPCM); IPCM_ternary decision diagrams (IPCM_TDDs); fault-tolerant systems; reliability; safety;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Binary decision diagrams (BDDs) and their extended format multi-state BDDs (MBDDs) have been adapted to solve a fault tree model for reliability analysis. This paper presents a new family of decision diagrams, multiple-valued decision diagrams (MDDs) for dependability analysis of fault tolerant systems. Both BDDs and MDDs can be used to find the exact solution for extremely large systems with arbitrary component failure distribution. However, as compared with the BDD approach, the MDD approach has two advantages: it incorporates imperfect fault coverage modeling automatically, also, it provides a straightforward and efficient solution to analyzing system safety. The reliability and safety of a fault tolerant computer system called 3P2M are analyzed to illustrate the advantages of the MDD approach.
引用
收藏
页码：891 / 897
页数：7
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