Wafer-scale growth of highly textured piezoelectric thin films by pulsed laser deposition for micro-scale sensors and actuators

被引：12
|
作者：
Nguyen, M. D. [1 ,2 ]
Tiggelaar, R. [1 ]
Aukes, T. [2 ]
Rijnders, G. [1 ]
Roelof, G. [1 ]
机构：
[1] Univ Twente, MESA Inst Nanotechnol, POB 217, NL-7500 AE Enschede, Netherlands
[2] Solmates BV, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
来源：
28TH MICROMECHANICS AND MICROSYSTEMS EUROPE WORKSHOP | 2017年 / 922卷
关键词：
ZIRCONATE-TITANATE FILMS; FABRICATION; PB(ZR; MEMS;
D O I：
10.1088/1742-6596/922/1/012022
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
Piezoelectric lead-zirconate-titanate (PZT) thin films were deposited on 4-inch (111) Pt/Ti/SiO2/Si(001) wafers using large-area pulsed laser deposition (PLD). This study was focused on the homogeneity in film thickness, microstructure, ferroelectric and piezoelectric properties of PZT thin films. The results indicated that the highly textured (001)-oriented PZT thin films with wafer-scale thickness homogeneity (990 nm +/- 0.8%) were obtained. The films were fabricated into piezoelectric cantilevers through a MEMS microfabrication process. The measured longitudinal piezoelectric coefficient (d(33f) = 210 pm/V +/- 1.6%) and piezoelectric transverse coefficient (e(31f) = -18.8 C/m(2) +/- 2.8%) were high and homogeneity across wafers. The high piezoelectric properties on Si wafers will extend industrial application of PZT thin films and further development of piezoMEMS.
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页数：7
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