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Deformation of top-down and bottom-up silver nanowires
被引:133
|作者:
Leach, Austin M.
[1
]
McDowell, Matt
[1
]
Gall, Ken
[1
]
机构:
[1] Georgia Inst Technol, George W Woodruff Sch Mech Engn, Sch Mat Sci & Engn, Atlanta, GA 30332 USA
关键词:
D O I:
10.1002/adfm.200600735
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
Atomistic simulations are employed to probe the deformation behaviour of experimentally observed top-down and bottom-up face-centered cubic silver nanowires. Stable < 110 > oriented nanowires with s rhombic and truncated-rhombic cross section are considered, representative of top-down geometries as well as the multiply twinned pentagonal nanowire that is commonly fabricated in a bottom -up approach. The tensile deformation of a stable, experimentally observed structure is simulated to failure for each nanowire structure. A detailed mechanistic explanation of the initial defect nucleation is provided for each nanowire. The three geometries are shown to exhibit different levels of strength and deform by a range of mechanisms depending on the nanowire structure. In particular the deformation behaviour of top-down and bottom-up nanowires is shown to be fundamentally different. The yield strength of nanowires ranging from 1 to 25 nm in diameter is provided and reveals that in addition to cross-sectional diameter, the strength of the nanowires is strongly tied to the structure. This study demonstrates that nanowire structure and size may be tailored for specific mechanical requirements in nanometer-scale devices.
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页码:43 / 53
页数:11
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