Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays

被引：11

作者：

Allen, Gregory ^{[1
]}

Edmonds, Larry D. ^{[1
]}

Swift, Gary ^{[2
]}

Carmichael, Carl ^{[2
]}

Tseng, Chen Wei ^{[2
]}

Heldt, Kevin ^{[3
]}

Anderson, Scott Arlo ^{[3
]}

Coe, Michael ^{[3
]}

机构：

[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA

[2] Xilinx Inc, San Jose, CA USA

[3] SEAKR Engn Inc, Centennial, CO 80111 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2011年 / 58卷 / 03期

关键词：

Error rate calculation; field programmable gate array; single event upset; triple modular redundancy;

D O I：

10.1109/TNS.2011.2105282

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present a test methodology for estimating system error rates of Field Programmable Gate Arrays (FPGAs) mitigated with Triple Modular Redundancy (TMR). The test methodology is founded in a mathematical model, which is also presented. Accelerator data from 90 nm Xilinx Military/Aerospace grade FPGA are shown to fit the model. Fault injection (FI) results are discussed and related to the test data. Design implementation and the corresponding impact of multiple bit upset (MBU) are also discussed.

引用

页码：1040 / 1046

页数：7

共 12 条

[1] Single event effects test results for advanced field programmable gate arrays
Allen, Gregory R.
Swift, Gary M.
NSREC: 2006 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2006, : 115 - +
[2] Area Estimation for Triple Modular Redundancy Field Programmable Gate Arrays
He, Hongjie
Guo, Baolong
Yan, Yunyi
INTELLIGENT DATA ANALYSIS AND APPLICATIONS, (ECC 2016), 2017, 535 : 249 - 256
[3] Recent Single Event Effects Results in Advanced Reconfigurable Field Programmable Gate Arrays
Allen, Gregory R.
Madias, George
Miller, Eric
Swift, Gary
2011 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2011, : 97 - 102
[4] Radiation-hardened triple-modular redundant field programmable gate array with a two-phase clock
Watanabe, Minoru
2023 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, ISCAS, 2023,
[5] A Comprehensive Methodology for Complex Field Programmable Gate Array Single Event Effects Test and Evaluation
Berg, Melanie D.
LaBel, Kenneth A.
Kim, Hak
Friendlich, Mark
Phan, Anthony
Perez, Christopher
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2009, 56 (02) : 366 - 374
[6] Performance Testing of the Triple Modular Redundancy Mitigation Circuit Test Environment Implementation in Field Programmable Gate Array Structures
Kubica, Marcin
Czerwinski, Robert
APPLIED SCIENCES-BASEL, 2024, 14 (19):
[7] An analysis of Single Event Upset dependencies on high frequency and architectural implementations within Actel RTAX-S family field programmable gate arrays
Berg, Melanie
Wang, Jih-Jong
Ladbury, Ray
Buchner, Steve
Kim, Hak
Howard, Jim
LaBel, Ken
Phan, Anthony
Irwin, Tim
Friendlich, Mark
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2006, 53 (06) : 3569 - 3574
[8] A grayscale skin and facial detection mechanism for use in conjunction with security system technology via graphical block methodologies on field programmable gate arrays
Tickle, Andrew J.
Smith, Jeremy S.
Wu, Q. Henry
VISUAL INFORMATION PROCESSING XVII, 2008, 6978
[9] Analysis of the error susceptibility of a field programmable gate array-based image compressor through random event injection simulation
Lopes Filho, A.
d'Amore, R.
IET COMPUTERS AND DIGITAL TECHNIQUES, 2012, 6 (03): : 160 - 165
[10] Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation
Hiemstra, DM
Chayab, F
Szajek, L
2004 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2004, : 79 - 84

← 1 2 →