In situ depth-resolved synchrotron radiation X-ray spectroscopy study of radiation-induced Au deposition

被引：3
|
作者：
Chen, Guang [1 ,2 ]
Du, Yonghua [3 ]
An, Pengfei [2 ]
Zheng, Lirong [2 ]
Chu, Shengqi [2 ]
Zhang, Jing [2 ]
机构：
[1] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
[2] Chinese Acad Sci, Beijing Synchrotron Radiat Facil, Inst High Energy Phys, Beijing 100049, Peoples R China
[3] Agcy Sci Technol & Res, Inst Chem & Engn Sci, 1 Pesek Rd, Jurong Isl 627833, Singapore
来源：
JOURNAL OF SYNCHROTRON RADIATION | 2019年 / 26卷
关键词：
radiation-induced reduction; confocal optic systems; micro-X-ray fluorescence; XANES; deposition processes; GOLD NANOPARTICLES; PLASMONIC NANOSTRUCTURE; ABSORPTION-SPECTROSCOPY; SURFACE; XANES;
D O I：
10.1107/S1600577519011111
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
To illustrate the process of synchrotron radiation induced reduction of tetrachloroauric solutions, a confocal synchrotron radiation X-ray spectroscopy experiments system has been introduced to monitor the depth-resolved elemental Au distribution and chemical species during the Au reduction reaction. Combining the results from confocal X-ray spectroscopy with that from X-ray contrast imaging, the mechanism of synchrotron radiation induced Au reduction, along with the process of Au deposition, were proposed. These demonstrations provide novel avenues to spatially resolved analysis of in situ solution radiolysis.
引用
收藏
页码：1940 / 1944
页数：5
相关论文
共 50 条
  • [1] Depth-Resolved Imaging of Radiation-Induced Doping Changes in Silicon
    Dang, Z. Y.
    Breese, M. B. H.
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2015, 4 (12) : P462 - P467
  • [2] Applications of synchrotron radiation-induced X-ray emission (SRIXE)
    Jones, KW
    Berry, WJ
    Borsay, DJ
    Cline, HT
    Conner, WC
    Fullmer, CS
    X-RAY SPECTROMETRY, 1997, 26 (06) : 350 - 358
  • [3] X-ray emission depth-resolved spectroscopy for investigation of nanolayers
    A. S. Shulakov
    Journal of Structural Chemistry, 2011, 52 (Suppl 1) : 1 - 12
  • [4] Synchrotron radiation-induced total reflection X-ray fluorescence analysis
    Meirer, F.
    Singh, A.
    Pepponi, G.
    Streli, C.
    Homma, T.
    Pianetta, P.
    TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 2010, 29 (06) : 479 - 496
  • [5] Depth-Resolved X-ray Absorption Spectroscopy by Means of Grazing Emission X-ray Fluorescence
    Kayser, Yves
    Sa, Jacinto
    Szlachetko, Jakub
    ANALYTICAL CHEMISTRY, 2015, 87 (21) : 10815 - 10821
  • [6] Depth-resolved photoemission spectroscopy with soft X-ray standing waves
    Yang, SH
    Mun, BS
    Kay, AW
    Kim, SK
    Kortright, JB
    Underwood, JH
    Hussain, Z
    Fadley, CS
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2001, 114 : 1089 - 1095
  • [7] Radiation-induced damage in x-ray spectroscopy of CdS nanoclusters
    Döllefeld, H
    McGinley, C
    Almousalami, S
    Möller, T
    Weller, H
    Eychmüller, A
    JOURNAL OF CHEMICAL PHYSICS, 2002, 117 (19): : 8953 - 8958
  • [8] Synchrotron Radiation-Induced X-Ray Fluorescence (SRXRF) Analyses Of The Bernstorf Gold
    Radtke, M.
    Reinholz, U.
    Gebhard, R.
    ARCHAEOMETRY, 2017, 59 (05) : 891 - 899
  • [9] In-situ Synchrotron Radiation X-ray Scattering Study On The Initial Structure Of Atomic Layer Deposition
    Park, Y. J.
    Lee, D. R.
    Baik, S.
    PHYSICS OF SEMICONDUCTORS: 30TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, 2011, 1399
  • [10] Radiation-induced debromination monitored by polarized X-ray absorption spectroscopy
    Fleurant, Marc
    Camus, Fabrice
    Besnard, Celine
    Ennifar, Eric
    Dumas, Philipe
    Pattison, Phil
    Schiltz, Marc
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2006, 62 : S205 - S205
12345