Coding gray-tone mask for refractive microlens fabrication

被引:40
|
作者
Yao, J
Su, JQ
Du, JL
Zhang, YX
Gao, FH
Gao, F
Guo, YK [1 ]
Cui, Z
机构
[1] Sichuan Univ, Dept Phys, Chengdu 610064, Peoples R China
[2] Rutherford Appleton Lab, Didcot OX11 0QX, Oxon, England
关键词
Coherent light - Computer simulation - Electron beam lithography - Integrated circuit layout - Masks - Microoptics - Optical devices - Photoresists;
D O I
10.1016/S0167-9317(00)00371-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new method has been developed to design gray-tone masks for microlens fabrication. Unlike previous methods which modulate the light intensity by changing the cell size or cell pitch only, the method relays on adjusting both the shape and position of a cell which gives an extra freedom to control the design accuracy. Based on the theory of partial coherent light and the resist development model, the intensity distribution through the gray-tone mask and exposure of photoresist have been simulated. Nonlinear effects in aerial image and resist development have been take into account to correct the mask design. A grey tone mask for microlens array has been fabricated and printed by a g-line stepper. Hemispherical photoresist structures have been achieved.
引用
收藏
页码:531 / 534
页数:4
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