X-Ray Spectroscopic Investigation of Chlorinated Graphene: Surface Structure and Electronic Effects

被引:54
|
作者
Zhang, Xu [1 ]
Schiros, Theanne [2 ]
Nordlund, Dennis [3 ]
Shin, Yong Cheol [4 ]
Kong, Jing [1 ]
Dresselhaus, Mildred [1 ]
Palacios, Tomas [1 ]
机构
[1] MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA
[2] Columbia Univ, EFRC, New York, NY 10027 USA
[3] Stanford Synchrotron Radiat Lightsource, SLAC Natl Accelerator Lab, Menlo Pk, CA 94025 USA
[4] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
关键词
chlorination; graphene; nonintrusive surface functionalization; surface electronic state; synchrotron-based X-ray spectroscopy; ABSORPTION; ADSORPTION; GRAPHITE;
D O I
10.1002/adfm.201500541
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Chemical doping of graphene represents a powerful means of tailoring its electronic properties. Synchrotron-based X-ray spectroscopy offers an effective route to investigate the surface electronic and chemical states of functionalizing dopants. In this work, a suite of X-ray techniques is used, including near edge X-ray absorption fine structure spectroscopy, X-ray photoemission spectroscopy, and photoemission threshold measurements, to systematically study plasma-based chlorinated graphene on different substrates, with special focus on its dopant concentration, surface binding energy, bonding configuration, and work function shift. Detailed spectroscopic evidence of C-Cl bond formation at the surface of single layer graphene and correlation of the magnitude of p-type doping with the surface coverage of adsorbed chlorine is demonstrated for the first time. It is shown that the chlorination process is a highly nonintrusive doping technology, which can effectively produce strongly p-doped graphene with the 2D nature and long-range periodicity of the electronic structure of graphene intact. The measurements also reveal that the interaction between graphene and chlorine atoms shows strong substrate effects in terms of both surface coverage and work function shift.
引用
收藏
页码:4163 / 4169
页数:7
相关论文
共 50 条
  • [1] X-RAY SPECTROSCOPIC INVESTIGATION OF ELECTRONIC-STRUCTURE OF DIAMOND
    UMENO, M
    WIECH, G
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1973, 59 (01): : 145 - 154
  • [2] The electronic structure of KTaO3:: a combined x-ray spectroscopic investigation
    Kuepper, K
    Postnikov, AV
    Moewes, A
    Schneider, B
    Matteucci, M
    Hesse, H
    Neumann, M
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2004, 16 (46) : 8213 - 8219
  • [3] X-ray absorption spectroscopic investigation of the electronic structure differences in solution and crystalline oxyhemoglobin
    Wilson, Samuel A.
    Green, Evan
    Mathews, Irimpan I.
    Benfatto, Maurizio
    Hodgson, Keith O.
    Hedman, Britt
    Sarangi, Ritimukta
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2013, 110 (41) : 16333 - 16338
  • [4] X-RAY SPECTROSCOPIC INVESTIGATION OF ELECTRONIC-STRUCTURE OF MG-CU ALLOYS
    NEDDERMEYER, H
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1976, 78 (02): : 609 - 614
  • [5] X-RAY SPECTROSCOPIC INVESTIGATION OF THE CORONAL STRUCTURE OF CAPELLA
    GRONENSCHILD, EHBM
    MEWE, R
    WESTERGAARD, NJ
    HEISE, J
    SEWARD, FD
    CHLEBOWSKI, T
    KUIN, NPM
    BRINKMAN, AC
    DIJKSTRA, JH
    SCHNOPPER, HW
    SPACE SCIENCE REVIEWS, 1981, 30 (1-4) : 185 - 189
  • [6] Electronic structure of thiaporphyrins: An X-ray photoelectron spectroscopic study
    Gopinath, CS
    Pandian, RP
    Manoharan, PT
    JOURNAL OF THE CHEMICAL SOCIETY-DALTON TRANSACTIONS, 1996, (07): : 1255 - 1259
  • [7] X-ray spectroscopic study of electronic structure of amorphous silicon and silicyne
    A. I. Mashin
    A. F. Khokhlov
    É. P. Domashevskaya
    V. A. Terekhov
    N. I. Mashin
    Semiconductors, 2001, 35 : 956 - 961
  • [8] X-ray spectroscopic studies of the bulk electronic structure of InGaN alloys
    McGuinness, C
    Dowries, JE
    Ryan, P
    Smith, KE
    Doppalapudi, D
    Moustakas, TD
    GAN AND RELATED ALLOYS-2002, 2003, 743 : 621 - 626
  • [9] X-ray spectroscopic investigations of electronic structure in aluminum coordination complexes
    Altman, Alison B.
    Arnold, John
    Minasian, Stefan G.
    Das Pemmaraju, C.
    Prendergast, David
    Shuh, David K.
    Tyliszczak, Tolek
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2014, 248
  • [10] X-ray spectroscopic study of electronic structure of amorphous silicon and silicyne
    Mashin, AI
    Khokhlov, AF
    Domashevskaya, ÉP
    Terekhov, VA
    Mashin, NI
    SEMICONDUCTORS, 2001, 35 (08) : 956 - 961