Use of Rician distributions to predict the distributions of ultrasonic flaw signals in the presence of backscattered noise

被引：0

作者：

Yalda, I ^{[1
]}

Margetan, FJ ^{[1
]}

Thompson, RB ^{[1
]}

机构：

[1] Iowa State Univ, Ctr NDE, Ames, IA 50011 USA

来源：

REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 17A AND 17B | 1998年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：105 / 112

页数：8

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