Unbiasedness and biasedness of the Jonckheere-Terpstra and the Kruskal-Wallis tests

被引:8
|
作者
Murakami, Hidetoshi [1 ]
Lee, Seong Keon [2 ]
机构
[1] Natl Def Acad, Dept Math, Yokosuka, Kanagawa 2398686, Japan
[2] Sungshin Univ, Dept Stat, Seoul 136742, South Korea
关键词
Jonckheere-Terpstra test; Kruskal Wallis test; Power function; Unbiasedness; RANK-TESTS; EXAMPLE;
D O I
10.1016/j.jkss.2014.10.001
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
Finding the unbiasedness and biasedness of test statistics is important in testing a hypothesis. In this study, the unbiasedness/biasedness of the Jonckheere-Terpstra test is investigated for ordered alternatives. Our results show that the one-sided Joncicheere-Terpstra test is unbiased for the location parameter family of distributions and that the non-randomized two-sided Jonckheere-Terpstra test is biased for the shifted location parameter. Additionally, the unbiasedness/biasedness of the Kruskal Wallis test is considered for the general two-sided alternatives. By giving a counter example, our investigation reveals that the Kruskal Wallis test is biased against a shifted location parameter for unequal sample sizes. Our results indicate that we require to consider a bias correction for the nonparametric tests. (C) 2014 The Korean Statistical Society. Published by Elsevier B.V. All rights reserved.
引用
收藏
页码:342 / 351
页数:10
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