Monitoring of large-area solar cell homogeneity by local irradiation

被引：0
|
作者：
Benda, V [1 ]
Asresahegn, AL [1 ]
Radil, J [1 ]
机构：
[1] Czech Tech Univ, Dept Electrotechnol, Prague 16627 6, Czech Republic
来源：
26TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY, CONFERENCE PROCEEDINGS: INTEGRATED MANAGEMENT OF ELECTRONIC MATERIALS PRODUCTION | 2003年
关键词：
D O I：
10.1109/ISSE.2003.1260535
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper refers about a possibility to check carrier lifetime distribution over the area of power (large-area) solar cells. The carrier lifetime in volume of the cell body can be evaluated using local irradiation of the surface of large-area solar cells with a laser diode (lambda = 820 nm) from measured values of open circuit voltage V-OC. The method can give information about recombination centres distribution in large-area solar cells. From V-OC distribution, also position and extent of local defects can also be determined. Solar cell diagnostic methods can be used to investigate the influence of technology on characteristics of solar cells, with the aim of increasing efficiency and reliability of solar cells.
引用
收藏
页码：295 / 297
页数：3
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