Large-format Multi-wafer Production of 5" GaSb-based Photodetectors by Molecular Beam Epitaxy

被引:2
|
作者
Loubyshev, Dmitri [1 ]
Fastenau, Joel M. [1 ]
Kattner, Michael [1 ]
Frey, Phillip [1 ]
Liu, Amy W. K. [1 ]
Furlong, Mark J. [2 ]
机构
[1] IQE IR, 119 Technol Dr, Bethlehem, PA 18015 USA
[2] IQE IR, Cardiff CF3 0LW, S Glam, Wales
来源
INFRARED TECHNOLOGY AND APPLICATIONS XLIII | 2017年 / 10177卷
关键词
Gallium Antimonide; GaSb epitaxy; molecular beam epitaxy; MBE; photodetector; substrate; compound semiconductor; INFRARED PHOTODIODES; SUPERLATTICE; DETECTORS;
D O I
10.1117/12.2263962
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
GaSb and its heterostructures grown by molecular beam epitaxy (MBE) have received much attention given their application in a wide range of mid-wave and long-wave IR photodetector applications. With the maturation of the MBE growth process, focus is now turned to improving manufacturing readiness and the transition to the production of large-format wafers. We will discuss the transition from the development of early detector layer structures on 2 '' diameter GaSb substrates, through today's 3 ''/4 '' production standard, and to the onset of 5 '' pilot production from the perspective of volume compound semiconductor manufacturing. We will report on the growth of 5 '' GaSb-based MWIR nBn detector structures using a large format 5x5" production MBE platform. Structural and optical properties, as well as electrical data from large-area mesa diodes will be presented and compared with results achieved with smaller batch size MBE reactor platform.
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页数:8
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