4H-silicon carbide (4H-SiC) bipolar junction transistors (BJTs);
high temperature;
intermediate frequency (IF) amplifiers;
matching networks;
HIGH-EFFICIENCY;
CURRENT GAIN;
CONTACTS;
NOISE;
GATE;
D O I:
10.1109/TED.2018.2804392
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper presents a two-stage small signal intermediate frequency amplifier for high-temperature communication systems. The proposed amplifier is implemented using in-house silicon carbide bipolar technology. Measurements show that the proposed amplifier can operate from room temperature up to 251 degrees C. At a center frequency of 54.6MHz, the amplifier has a gain of 22 dB at room temperature, which decreases gradually to 16 dB at 251 degrees C. Throughout the measured temperature range, it achieves an input and output return loss of less than -7 and -11 dB, respectively. The amplifier has a 1-dB output compression point of about 1.4 dBm, which remains fairly constant with temperature. Each amplifier stage is biased with a collector current of 10 mA and a base-collector voltage of 3 V. Under the aforementioned biasing, the maximum power dissipation of the amplifier is 221 mW.
机构:
KTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Ascatron AB, SE-16440 Stockholm, SwedenKTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Hussain, Muhammad Waqar
Elahipanah, Hossein
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机构:
KTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Ascatron AB, SE-16440 Stockholm, SwedenKTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Elahipanah, Hossein
Schroder, Stephan
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机构:
KTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Ascatron AB, SE-16440 Stockholm, SwedenKTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Schroder, Stephan
Rodriguez, Saul
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机构:
KTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Ascatron AB, SE-16440 Stockholm, SwedenKTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Rodriguez, Saul
Malm, Bengt Gunnar
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机构:
KTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Ascatron AB, SE-16440 Stockholm, SwedenKTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Malm, Bengt Gunnar
Ostling, Mikael
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机构:
KTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Ascatron AB, SE-16440 Stockholm, SwedenKTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Ostling, Mikael
Rusu, Ana
论文数: 0引用数: 0
h-index: 0
机构:
KTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
Ascatron AB, SE-16440 Stockholm, SwedenKTH Royal Inst Technol, Dept Integrated Devices & Circuits, SE-10044 Stockholm, Sweden
机构:
Hungarian Acad Sci, Res Inst Solid State Phys & Opt, H-1525 Budapest, HungaryHungarian Acad Sci, Res Inst Solid State Phys & Opt, H-1525 Budapest, Hungary