The annealing of La0.67Sr0.33MnO3 polycrystalline films

被引：0
|
作者：
Xu, QY [1 ]
Gu, KM
Tang, T
Ni, G
Wang, ZM
Sang, H
Du, YW
机构：
[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Ctr Adv Studies Sci & Technol Microstruct, Nanjing 210093, Peoples R China
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 2001年 / 20卷 / 14期
基金：
中国国家自然科学基金;
关键词：
D O I：
10.1023/A:1010946401115
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Polycrystalline films of lanthanum compounds were fabricated using magnetron sputtering and were studied under different annealing temperatures. X-ray diffraction analysis indicated better crystallization of films with increasing temperature. Electrical resistivity dropped on increasing the temperature to 500 °C. The resistivity remained unchanged while magnetoresistance increased above 500 °C.
引用
收藏
页码：1317 / 1318
页数：2
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