2D Imaging System With Optical Tracking for EMI Source Localization

被引：0
|
作者：
He, Hui [1 ]
Khilkevich, Victor [1 ]
Pommerenke, David [1 ]
机构：
[1] Missouri Univ Sci & Technol, Rolla, MO 65409 USA
来源：
2015 IEEE SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND SIGNAL INTEGRITY | 2015年
基金：
美国国家科学基金会;
关键词：
optical tracking; source localization; EMI; ESM; SAR; near-field scanning;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This research presents a 2D imaging system with optical tracking to localize radiating sources. Optical tracking system is used for localizing the position of the near field measurement probe. Emission source microscopy (ESM) algorithm derived from synthetic aperture radar (SAR) technique is used to localize radiating sources.
引用
收藏
页码：107 / 110
页数：4
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