The effect of plasma instabilities on the background impurities in charge breeder ECRIS

被引:3
|
作者
Tarvainen, Olli [1 ]
Angot, Julien [2 ]
Izotov, Ivan [3 ]
Skalyga, Vadim [3 ]
Koivisto, Hannu [1 ]
Thuillier, Thomas [2 ]
Kalvas, Taneli [1 ]
Toivanen, Ville [4 ]
Kronholm, Risto [1 ]
Lamy, Thierry [2 ]
机构
[1] Univ Jyvaskyla, Dept Phys, Jyvaskyla 40500, Finland
[2] Univ Grenoble Alpes, CNRS, IN2P3, Grenoble Inst Engn INP,LPSC, F-38000 Grenoble, France
[3] RAS, Inst Appl Phys, 46 Ulyanova St, Nizhnii Novgorod 603950, Russia
[4] GANIL, F-14076 Caen 5, France
关键词
D O I
10.1063/1.5053348
中图分类号
O59 [应用物理学];
学科分类号
摘要
Experimental observations of plasma instabilities in the 14.5 GHz PHOENIX charge breeder ECRIS are summarized. It has been found that the injection of Cs-133(+) or Rb-85(+) into oxygen discharge of the CB-ECRIS can trigger electron cyclotron instabilities, which results to sputtering of the surfaces exposed to the plasma, followed by up to an order of magnitude increase of impurity currents in the extracted n+ charge state distribution. The transition from stable to unstable plasma regime is caused by gradual accumulation and ionization of Cs/Rb altering the discharge parameters in 10 - 100 ms time scale, not by a prompt interaction between the incident ion beam and the ECRIS plasma. This time scale is similar to the reported breeding times of the high charge state Cs and Rb ions. Since the commonly applied method of measuring the breeding time, i.e. pulsing the 1+ injection, clearly affects the buffer gas discharge, it is argued that the actual breeding times in continuous operation can differ from those obtained by studying the injection transient.
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页数:3
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