Roughness of thin perfluoropolyether lubricant films: Influence on disk drive technology

被引:49
|
作者
Mate, CM [1 ]
Toney, MF
Leach, KA
机构
[1] IBM, Almaden Res Ctr, San Jose, CA 95120 USA
[2] Univ Massachusetts, Dept Polymer Sci & Engn, Amherst, MA 01003 USA
基金
美国国家科学基金会;
关键词
disk drives; lubrication; X-ray reflectivity;
D O I
10.1109/20.950978
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In disk drive technology, lubricant thickness and roughness are important, but often overlooked, contributors to slider-disk spacing. In this paper, we use X-ray reflectivity to measure the thickness and lubricant-air roughness of a perfluoropolyether lubricant (Fomblin Zdol) on silicon wafers and carbon overcoats. For Zdol on smooth silicon, the roughness increases with increasing lubricant thickness consistent with capillary wave roughening. For Zdol on the rougher surface of amorphous hydrogenated carbon, the,lubricant smoothes to a value limited by the capillary wave roughening. We show that the lubricant density above the surface does not reach the density of air until approximately 3 sigma away from the average lubricant thickness. This lubricant-air interface width contributes substantially to current and future slider-disk spacings.
引用
收藏
页码:1821 / 1823
页数:3
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