Scanning probe photothermal FTIR spectroscopy and microscopy.

被引：0
|
作者：
Adams, DM [1 ]
机构：
[1] Columbia Univ, Dept Chem, New York, NY 10027 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2003年 / 225卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
120-PMSE
引用
收藏
页码：U678 / U678
页数：1
相关论文
共 50 条
  • [1] Scanning probe microscopy.
    Flis-Kabulska, I
    PRZEMYSL CHEMICZNY, 1999, 78 (02): : 47 - 50
  • [2] Femtosecond-optical spectroscopy and scanning probe microscopy.
    Feldstein, MJ
    Scherer, NF
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1996, 211 : 104 - PHYS
  • [3] Educational applications of scanning probe microscopy.
    Rabke, CE
    McMurtry, G
    Leavitt, AJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1996, 212 : 347 - POLY
  • [4] Scanning probe microscopy. Methods and instruments
    Yaminskij, I.V.
    Rossijskij Khimicheskij Zhurnal, 40 (01): : 111 - 120
  • [5] Gradient reference surfaces for scanning probe microscopy.
    Fasolka, M
    Briggman, KA
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 227 : U553 - U553
  • [6] Micromachined aperture probe tip for multifunctional scanning probe microscopy.
    Abraham, M
    Ehrfeld, W
    Lacher, M
    Mayr, K
    Noell, W
    Gunther, P
    Barenz, J
    MICROMACHINING AND IMAGING, 1997, 3009 : 34 - 42
  • [7] Micromachined aperture probe tip for multifunctional scanning probe microscopy.
    Abraham, M
    Ehrfeld, W
    Lacher, M
    Marti, O
    Mayr, K
    Noell, W
    Guthner, P
    Barenz, J
    MICRO-OPTICAL TECHNOLOGIES FOR MEASUREMENT, SENSORS, AND MICROSYSTEMS II AND OPTICAL FIBER SENSOR TECHNOLOGIES AND APPLICATIONS, 1997, 3099 : 248 - 256
  • [8] Scanning probe microscopy and spectroscopy
    Wiesendanger, R.
    Measurement Science & Technology, 1995, 6 (05):
  • [9] Modern Scanning Electron Microscopy. 3. Electron Probe
    Novikov, Yu. A.
    JOURNAL OF SURFACE INVESTIGATION, 2024, 18 (01): : 185 - 209
  • [10] Interaction force detection in scanning probe microscopy. Methods and applications
    1778, (72):
12345