Increased IEF Throughput Using a Dual-Electrode Assembly

被引:0
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作者
Smejkal, Gary B. [1 ]
Bauer, Darren J. [1 ]
机构
[1] Univ New Hampshire, Hubbard Ctr Genome Studies, Durham, NH 03824 USA
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暂无
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
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页码:28 / 28
页数:1
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