Uniform derandomization from pathetic lower bounds

被引:2
|
作者
Allender, Eric [1 ]
Arvind, V. [2 ]
Santhanam, Rahul [3 ]
Wang, Fengming [1 ]
机构
[1] Rutgers State Univ, Dept Comp Sci, New Brunswick, NJ 08855 USA
[2] Inst Math Sci, Madras 600113, Tamil Nadu, India
[3] Univ Edinburgh, Sch Informat, Edinburgh EH8 9AD, Midlothian, Scotland
基金
美国国家科学基金会;
关键词
computational complexity; derandomization; circuit complexity; ARITHMETIC CIRCUITS; PSEUDORANDOM GENERATORS; THRESHOLD CIRCUITS; HITTING SETS; RANDOMNESS; FORMULAS; HARDNESS; COMPUTATION; COMPLEXITY; TRADEOFFS;
D O I
10.1098/rsta.2011.0318
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The notion of probabilistic computation dates back at least to Turing, who also wrestled with the practical problems of how to implement probabilistic algorithms on machines with, at best, very limited access to randomness. A more recent line of research, known as derandomization, studies the extent to which randomness is superfluous. A recurring theme in the literature on derandomization is that probabilistic algorithms can be simulated quickly by deterministic algorithms, if one can obtain impressive (i.e. superpolynomial, or even nearly exponential) circuit size lower bounds for certain problems. In contrast to what is needed for derandomization, existing lower bounds seem rather pathetic. Here, we present two instances where 'pathetic' lower bounds of the form n(1+epsilon) would suffice to derandomize interesting classes of probabilistic algorithms. We show the following: - If the word problem over S-5 requires constant-depth threshold circuits of size n(1+epsilon) for some epsilon > 0, then any language accepted by uniform polynomial size probabilistic threshold circuits can be solved in subexponential time (and, more strongly, can be accepted by a uniform family of deterministic constant-depth threshold circuits of subexponential size). - If there are no constant-depth arithmetic circuits of size n(1+epsilon) for the problem of multiplying a sequence of n 3 x 3 matrices, then, for every constant d, black-box identity testing for depth-d arithmetic circuits with bounded individual degree can be performed in subexponential time (and even by a uniform family of deterministic constant-depth AC(0) circuits of subexponential size).
引用
收藏
页码:3512 / 3535
页数:24
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