Towards Improved Survivability in Safety-Critical Systems

Performance demand of Critical Real-Time Embedded (CRTE) systems implementing safety-related system features grows at an exponential rate. Only modern semiconductor technologies can satisfy CRTE systems performance needs efficiently. However, those technologies lead to high failure rates, thus lowering survivability of chips to unacceptable levels for CRTE systems. This paper presents SESACS architecture (Surviving Errors in SAfety-Critical Systems), a paradigm shift in the design of CRTE systems. SESACS is a new system design methodology consisting of three main components: (i) a multicore hardware/firmware platform capable of detecting and diagnosing hardware faults of any type with minimal impact on the worst-case execution time (WCET), recovering quickly from errors, and properly reconfiguring the system so that the resulting system exhibits a predictable and analyzable degradation in WCET; (ii) a set of analysis methods and tools to prove the timing correctness of the reconfigured system; and (iii) a white-box methodology and tools to prove the functional safety of the system and compliance with industry standards. This new design paradigm will deliver huge benefits to the embedded systems industry for several decades by enabling the use of more cost-effective multicore hardware platforms built on top of modern semiconductor technologies, thereby enabling higher performance, and reducing weight and power dissipation. This new paradigm will further extend the life of embedded systems, therefore, reducing warranty and early replacement costs.