An FIB-SEM slice-and-view study of three-dimensional beta phase distribution in Ti-6Al-4V

被引：3

作者：

Ding, Rengen ^{[1
]}

Jones, Ian P. ^{[1
]}

机构：

[1] Univ Birmingham, Sch Met & Mat, Birmingham B15 2TT, W Midlands, England

来源：

JOURNAL OF ELECTRON MICROSCOPY | 2011年 / 60卷 / 02期

基金：

英国工程与自然科学研究理事会;

关键词：

FIB; beta phase; slice and view; 3D reconstruction;

D O I：

10.1093/jmicro/dfr008

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In the scanning electron microscope, weak secondary electron contrast between the alpha and beta phases of a Ti-6Al-4V alloy can be improved via imaging conditions such as beam voltage and current. Dual beam focussed ion beam-scanning electron microscopes are thereby suited for characterising micron and sub-micron microstructural features of Ti-6Al-4V in three dimensions via serial-sectioning procedures.

引用

页码：149 / 155

页数：7

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