Recovery in fault-tolerant distributed microcontrollers

被引：0

作者：

Rennels, DA ^{[1
]}

Hwang, R ^{[1
]}

机构：

[1] Univ Calif Los Angeles, Dept Comp Sci, Los Angeles, CA 90024 USA

来源：

INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS AND NETWORKS, PROCEEDINGS | 2001年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper describes the use of fault-tolerance in a microcontroller node to be used in a network of embedded processors. It is primarily motivated by long-life space applications where radiation-induced transient errors will be a frequent occurrence, and a few chip failures may be expected before a mission is completed. A testbed has been constructed, and a real-time executive has been developed and tested in it. Preliminary fault-insertion testing has been started. Due to interconnection constraints for latchup circumvention and other reasons, we have chosen a design that is not Byzantine resilient. Even though inconsistent signaling may, occur occasionally, multiple recovery actions must converge to a successful testing and restart of the system to regain correct functionality.

引用

页码：475 / 480

页数：4

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