A Note on the ARL of Two-Sided Bernoulli-Based CUSUM Control Charts

被引：15
|
作者：
Megahed, Fadel M. [1 ]
Kensler, Jennifer L. K. [2 ]
Bedair, Khaled [2 ]
Woodall, William H. [2 ]
机构：
[1] Virginia Tech, Grado Dept Ind & Syst Engn, Blacksburg, VA 24061 USA
[2] Virginia Tech, Dept Stat, Blacksburg, VA 24061 USA
来源：
JOURNAL OF QUALITY TECHNOLOGY | 2011年 / 43卷 / 01期
基金：
美国国家科学基金会;
关键词：
Average Run Length; Bernoulli CUSUM; Risk-Adjustment; Statistical Process Control; Surgical Outcomes; PROPORTION;
D O I：
10.1080/00224065.2011.11917844
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this article, we examine the average run length (ARL) properties of two types of two-sided Bernoulli cumulative sum (CUSUM) control charts. In particular, we give the conditions under which the ARL of the two-sided Bernoulli CUSUM chart can be determined exactly from the ARLs of the corresponding upper and lower Bernoulli CUSUM charts. This ARL relationship is established for both the standard industrial application and the risk-adjusted health-care monitoring application.
引用
收藏
页码：43 / 49
页数：7
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