CACTI-P: Architecture- Level Modeling for SRAM-based Structures with Advanced Leakage Reduction Techniques

被引:0
|
作者
Li, Sheng [1 ]
Chen, Ke [1 ,2 ]
Ahn, Jung Ho [3 ]
Brockman, Jay B. [2 ]
Jouppi, Norman P. [1 ]
机构
[1] Hewlett Packard Labs, Palo Alto, CA 94304 USA
[2] Univ Notre Dame, Notre Dame, IN USA
[3] Seoul Natl Univ, Seoul, South Korea
基金
新加坡国家研究基金会;
关键词
Leakage power management; power-gating; circuit modeling; SRAM; cache; manycore processor; SLEEP TRANSISTOR; CMOS TECHNOLOGY; DESIGN;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper introduces CACTI-P, the first architecture-level integrated power, area, and timing modeling framework for SRAM-based structures with advanced leakage power reduction techniques. CACTI-P supports modeling of major leakage power reduction approaches including power-gating, long channel devices, and Hi-k metal gate devices. Because it accounts for implementation overheads, CACTI-P enables in-depth study of architecture-level tradeoffs for advanced leakage power management schemes. We illustrate the potential applicability of CACTI-P in the design and analysis of leakage power reduction techniques of future manycore processors by applying nanosecond scale power-gating to different levels of cache for a 64 core multithreaded architecture at the 22nm technology. Combining results from CACTI-P and a performance simulator, we find that although nanosecond scale power-gating is a powerful way to minimize leakage power for all levels of caches, its severe impacts on processor performance and energy when being used for L1 data caches make nanosecond scale power-gating a better fit for caches closer to main memory.
引用
收藏
页码:694 / 701
页数:8
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