On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement

被引:8
|
作者
Reddy, Gaurav Rajavendra [1 ]
Xanthopoulos, Constantinos [1 ]
Makris, Yiorgos [1 ]
机构
[1] Univ Texas Dallas, Dept Elect & Comp Engn, Richardson, TX 75080 USA
关键词
Database enhancement; design for manufacturability; lithographic hotspot detection; machine learning; physical design; synthetic pattern generation;
D O I
10.1109/TCAD.2021.3049285
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Design hotspots are layout patterns which may cause defects due to complex design and process interactions. Several machine learning and pattern matching-based methods have been proposed to identify and correct them early during design stages. However, almost all of them suffer from high false-alarm rates, mainly because they are oblivious to the root causes of hotspots. In this work, we seek to address this limitation by using a novel database enhancement approach through synthetic pattern generation based on a carefully crafted design of experiments. We evaluate the effectiveness of the proposed method using industry-standard tools and designs and demonstrate more than 3x reduction in classification error in comparison to the state-of-the-art.
引用
收藏
页码:2522 / 2527
页数:6
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