Effect of carbon inclusion in the Ni-P coating on shearing behavior of Sn4Ag0.5Cu ball grid array solder joints

被引:0
|
作者
Gu, X. [1 ]
Chan, Y. C. [1 ]
Wu, B. Y. [1 ]
Yang, D. [1 ]
机构
[1] City Univ Hong Kong, Dept Elect Engn, Kowloon Tong, Hong Kong, Peoples R China
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This study employed an electroless Ni-P-carbon nanotubes (Ni-P-CNTs) composite coating as a pad finish for electronic packaging. It aimed at investigating the effect of carbon on the mechanical behavior and microstructure of ball grid array (BGA) solder joints after multiple reflows. Electroless Ni-P and electroless Ni-P-CNTs composite coatings with the same P-content were prepared for comparison. It was found that the carbon in the coating increased the brittleness of solder joints and weakened their shear strength. After shearing tests, more brittle fractures occurred in the intermetallic compound (IMC) layer in the Sn-4Ag-0.5Cu/Ni-P-CNTs (SAC/Ni-P-CNTs) solder joints. After multiple reflows, a Ni(3)Sn(4) IMC layer and a P-rich layer were formed in the solder joints on both coatings. The IMC layers in the SAC/Ni-P solder joints were found to be compact with chunky-shaped grains, whilst the IMC layers in the SAC/Ni-P-CNTs solder joints were porous with needle-shaped grains.
引用
收藏
页码:653 / 657
页数:5
相关论文
共 50 条
  • [1] The shearing behavior and microstructure of Sn-4Ag-0.5Cu solder joints on a Ni-P-carbon nanotubes composite coating
    Gu, X.
    Chan, Y. C.
    Yang, D.
    Wu, B. Y.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 468 (1-2) : 553 - 557
  • [2] The shearing behavior and microstructure of Sn-4Ag-0.5Cu solder joints on a Ni-P-carbon nanotubes composite coating
    Gu, X.
    Chan, Y.C.
    Yang, D.
    Wu, B.Y.
    Journal of Alloys and Compounds, 2009, 468 (1-2): : 553 - 557
  • [3] Electromigration behavior of Cu/Sn3.0Ag0.5Cu/Cu ball grid array solder joints
    Yiming Jiang
    Hailong Li
    Gang Chen
    Yunhui Mei
    Meiyu Wang
    Journal of Materials Science: Materials in Electronics, 2019, 30 : 6224 - 6233
  • [4] Electromigration behavior of Cu/Sn3.0Ag0.5Cu/Cu ball grid array solder joints
    Jiang, Yiming
    Li, Hailong
    Chen, Gang
    Mei, Yunhui
    Wang, Meiyu
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2019, 30 (06) : 6224 - 6233
  • [5] Shear performance of microscale ball grid array structure Cu(Ni)/Sn-3.0Ag-0.5Cu/Cu(Ni) solder joints at low temperatures
    Li, Wangyun
    Gui, Jun
    Qin, Hongbo
    Yang, Daoguo
    MATERIALS TODAY COMMUNICATIONS, 2022, 30
  • [6] Roles of phosphorous in Sn4Ag0.5Cu solder reaction with electrolytic Ni-Au
    Chung, C. Key
    Huang, T. C.
    Shia, R.
    Yang, T. L.
    Kao, C. R.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2012, 539 : 57 - 62
  • [7] Roles of phosphorous in Sn4Ag0.5Cu solder reaction with electrolytic Ni-Au
    Key Chung, C.
    Huang, T.C.
    Shia, R.
    Yang, T.L.
    Kao, C.R.
    Journal of Alloys and Compounds, 2012, 539 : 57 - 62
  • [8] Low cycle fatigue performance of ball grid array structure Cu/Sn-3.0Ag-0.5Cu/Cu solder joints
    Qin, H. B.
    Li, W. Y.
    Zhou, M. B.
    Zhang, X. P.
    MICROELECTRONICS RELIABILITY, 2014, 54 (12) : 2911 - 2921
  • [9] Geometry effect on mechanical performance and fracture behavior of micro-scale ball grid array structure Cu/Sn-3.0Ag-0.5Cu/Cu solder joints
    Qin, H. B.
    Zhang, X. P.
    Zhou, M. B.
    Li, X. P.
    Mai, Y-W
    MICROELECTRONICS RELIABILITY, 2015, 55 (08) : 1214 - 1225
  • [10] Effect of electromigration on interfacial reaction in Ni/Sn3.0Ag0.5Cu/Au/Pd/Ni-P flip chip solder joints
    Huang Ming-Liang
    Chen Lei-Da
    Zhou Shao-Ming
    Zhao Ning
    ACTA PHYSICA SINICA, 2012, 61 (19)