Common Problems with FT-IR Instruments and How to Avoid Them

被引：0
|
作者：
Miseo, Ellen, V [1 ,2 ,3 ]
Briggs, Jenni [4 ]
机构：
[1] Coblentz Soc, Ashland, OR 97520 USA
[2] Soc Appl Spect, New Market, MD USA
[3] NYU, New York, NY 10003 USA
[4] PIKE Technol, Fitchburg, WI USA
来源：
SPECTROSCOPY | 2021年 / 36卷
关键词：
D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：15 / 16
页数：2
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