Sensor behavior of MoS2 field-effect transistor with light injection toward chemical recognition

被引:7
|
作者
Alam, Md Iftekharul [1 ]
Takaoka, Tsuyoshi [2 ]
Waizumi, Hiroki [1 ]
Tanaka, Yudai [1 ]
Al Mamun, Muhammad Shamim [1 ]
Ando, Atsushi [3 ]
Komeda, Tadahiro [2 ]
机构
[1] Tohoku Univ, Grad Sch Sci, Dept Chem, Aoba Ku, 6-3 Aramaki Aza Aoba, Sendai, Miyagi 9808578, Japan
[2] Tohoku Univ, Inst Multidisciplinary Res Adv Mat IMRAM, Tagen, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9800877, Japan
[3] Device Technol Res Inst, Natl Inst Adv Ind Sci & Technol AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 3058568, Japan
关键词
MONOLAYER;
D O I
10.1039/d1ra03698j
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The application of field-effect transistor (FET) devices with atomically thin channels as sensors has attracted significant attention, where the adsorption of atoms/molecules on the channels can be detected by the change in the properties of FET. Thus, to further enhance the chemical sensitivity of FETs, we developed a method to distinguish the chemical properties of adsorbates from the electric behavior of FET devices. Herein, we explored the variation in the FET properties of an MoS2-FET upon visible light injection and the effect of molecule adsorption for chemical recognition. By injecting light, the drain current (I-d) increased from the light-off state, which is defined as (Delta I-d)(ph). We examined this effect using CuPc molecules deposited on the channel. The (Delta I-d)(ph)vs. wavelength continuous spectrum in the visible region showed a peak at the energy for the excitation from the highest occupied orbital (HOMO) to the molecule-induced state (MIS). The energy position and the intensity of this feature showed a sensitive variation with the adsorption of the CuPc molecule and are in good agreement with previously reported photo-absorption spectroscopy data, indicating that this technique can be employed for chemical recognition.
引用
收藏
页码:26509 / 26515
页数:7
相关论文
共 50 条
  • [1] MoS2 field-effect transistor with graphene contacts
    Andleeb, Shaista
    Eom, Jonghwa
    Naz, Nabila Rauf
    Singh, Arun Kumar
    JOURNAL OF MATERIALS CHEMISTRY C, 2017, 5 (32) : 8308 - 8314
  • [2] Ambipolar MoS2 Field-Effect Transistor by Spatially Controlled Chemical Doping
    Liu, Xiaochi
    Yuan, Yahua
    Qu, Deshun
    Sun, Jian
    PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2019, 13 (09):
  • [3] One step sputtered MoS2 field-effect transistor
    Acar, Merve
    MICRO AND NANOSTRUCTURES, 2022, 165
  • [4] A MOS2 FIELD-EFFECT TRANSISTOR WITH A LIQUID BACK GATE
    Lin, Kabin
    Yuan, Zhishan
    Yu, Yu
    Li, Kun
    Yang, Haojie
    He, Pinyao
    Ma, Jian
    Sha, Jingjie
    Chen, Yunfei
    PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION, 2016, VOL. 10, 2017,
  • [5] Infrared light gated MoS2 field effect transistor
    Fang, Huajing
    Lin, Ziyuan
    Wang, Xinsheng
    Tang, Chun-Yin
    Chen, Yan
    Zhang, Fan
    Chai, Yang
    Li, Qiang
    Yan, Qingfeng
    Chan, H. L. W.
    Dai, Ji-Yan
    OPTICS EXPRESS, 2015, 23 (25): : 31908 - 31914
  • [6] Probing the Field-Effect Transistor with Monolayer MoS2 Prepared by APCVD
    Han, Tao
    Liu, Hongxia
    Wang, Shulong
    Chen, Shupeng
    Xie, Haiwu
    Yang, Kun
    NANOMATERIALS, 2019, 9 (09)
  • [7] A Symmetric Tunnel Field-Effect Transistor Based on MoS2/Black Phosphorus/MoS2 Nanolayered Heterostructures
    Jiang, Xixi
    Shi, Xinyao
    Zhang, Min
    Wang, Yarong
    Gu, Zhenghao
    Chen, Lin
    Zhu, Hao
    Zhang, Kai
    Sun, Qingqing
    Zhang, David Wei
    ACS APPLIED NANO MATERIALS, 2019, 2 (09) : 5674 - 5680
  • [8] Characteristic analysis of the MoS2/SiO2 interface field-effect transistor with varying MoS2 layers
    Li, Haixia
    Li, Youyong
    Jiang, Han
    Mao, Lingfeng
    Ni, Yanan
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2023, 34 (05)
  • [9] Characteristic analysis of the MoS2/SiO2 interface field-effect transistor with varying MoS2 layers
    Haixia Li
    Youyong Li
    Han Jiang
    Lingfeng Mao
    Yanan Ni
    Journal of Materials Science: Materials in Electronics, 2023, 34
  • [10] Low Frequency Noise in MoS2 Negative Capacitance Field-effect Transistor
    Alghamdi, Sami
    Si, Mengwei
    Yang, Lingming
    Ye, Peide D.
    2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2018,