共 50 条
- [6] Stress Analysis for SiC Power Devices Packaging by Raman Spectroscopy 2018 13TH INTERNATIONAL MICROSYSTEMS, PACKAGING, ASSEMBLY AND CIRCUITS TECHNOLOGY CONFERENCE (IMPACT), 2018, : 293 - 296
- [7] Depth distribution of radiation defects in irradiated diamonds by confocal Raman spectroscopy JOURNAL OF MINING INSTITUTE, 2024, 266 : 179 - 187
- [8] Raman Scattering Study of Stress Distribution around Dislocation in SiC SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 : 337 - +
- [9] Evaluation of Thermal Cycle Stress in SiC Power Devices by Raman Spectroscopy 2018 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING AND IMAPS ALL ASIA CONFERENCE (ICEP-IAAC), 2018, : 579 - 582