共 50 条
- [1] Test-Set Reordering for Improving Diagnosability 2017 IEEE 35TH VLSI TEST SYMPOSIUM (VTS), 2017,
- [4] Test-adequacy and statistical testing: Combining different properties of a test-set 15TH INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING, PROCEEDINGS, 2004, : 161 - 172
- [5] Optimal Test-Set Selection for Fault Diagnosis Improvement 2011 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT), 2011, : 93 - 99
- [6] Explicit Defense Actions Against Test-Set Attacks THIRTY-FIRST AAAI CONFERENCE ON ARTIFICIAL INTELLIGENCE, 2017, : 1274 - 1280
- [7] On the Effective Modeling of the Test-Set Non-linearity 2018 91ST ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG): WIDEBAND MODULATED TEST SIGNALS FOR NETWORK ANALYSIS OF WIRELESS INFRASTRUCTURE BUILDING BLOCKS, 2018,
- [8] A Generalized Time-Domain Waveform Test-Set 2008 EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, 2008, : 1393 - +
- [9] A precompliance EMC test-set based on a sampling oscilloscope IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2, 2002, : 1197 - 1201