High-resolution soft X-ray bulk sensitive photoemission from strongly correlated systems

被引:16
|
作者
Suga, S [1 ]
Sekiyama, A [1 ]
机构
[1] Osaka Univ, Grad Sch Engn Sci, Dept Mat Phys, Toyonaka, Osaka 5608531, Japan
关键词
Kondo resonance; valence fluctuation; correlated systems; bulk electronic states; surface electronic states; high resolution photoemission;
D O I
10.1016/S0368-2048(00)00313-3
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
In order to probe bulk electronic states of correlated electron systems near the Fermi level, high resolution photoemission spectroscopy by excitation in the soft X-ray region above several hundred eV is a very powerful tool. The best combination of the light source, analyzer, samples and miscellaneous experimental conditions is required. Photon resolution down to 50 meV and photoelectron total energy resolution down to 80 meV is realized near 1 keV as a breakthrough of bulk sensitive high resolution photoemission spectroscopy (BHPES), in which surface 4f electronic states are found to be significantly depressed. The BHPES spectra are very much different from the result of surface sensitive spectra measured slightly above 100 eV or by use of He II and I. Some BHPES results are demonstrated for Yb and Ce Kondo and valence fluctuating compounds. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
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页码:659 / 668
页数:10
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