Thermal characterization of micro-structured NiTi samples by 3ω scanning thermal microscopy

被引：5
|
作者：
Gibkes, J. [1 ]
Chirtoc, M. [2 ]
Antoniow, J. S. [2 ]
Wernhardt, R. [1 ]
Pelzl, J. [1 ]
机构：
[1] Ruhr Univ Bochum, Inst Expt Phys, D-44801 Bochum, Germany
[2] Univ Reims, UTAP, LTP, F-51687 Reims 2, France
来源：
EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS | 2008年 / 153卷 / 1期
关键词：
Shape Memory; European Physical Journal Special Topic; Temperature Dependent Measurement; Peltier Cooler; Thermal Microscope;
D O I：
10.1140/epjst/e2008-00415-7
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The lateral modifocation of the thermal conductivity of a NiTi sample have been measured by scanning thermal microscope using the 3 omega-technique. Squares of lateral length in the micrometer range had been drawn in a polycrystalline NiTi sample by a focussed ion beam of Ga. Amplitude and phase of the 3 omega-signal have been recorded at some selected positions as a function of frequency between 10Hz and 10 KHz and as a function of position at selected modulation frequencies. The 3 omega-signals are modified inside the squares as well as the border lines and also change when the temperature is increased above the martensite-austenite transition temperature.
引用
收藏
页码：151 / 154
页数：4
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