Analyzing the Reduction of Test Suite Redundancy

被引:0
|
作者
Pill, Ingo [1 ]
Jehan, Seema [1 ]
Wotawa, Franz [1 ]
Nica, Mihai [2 ]
机构
[1] Graz Univ Technol, Inst Software Technol, Inffeldgasse 16b-2, A-8010 Graz, Austria
[2] AVL GmbH, A-8020 Graz, Austria
关键词
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
When testing complex products, one would certainly tend towards implementing an extensive test set In order to stimulate and evaluate the device under scrutiny to the best of one's knowledge. Test suite size is however also directly related to the time needed for its execution, and the related costs drawing on a project's budget. The motivation to keep test suites as small as possible but also achieve maximum effectiveness at identifying faults is thus certainly an obvious one. We locus on algorithms that for a given test suite remove those test cases redundant in terms or fault identification capabilities. with the aim of assuring that the resulting test suite still fulfills certain properties in respect of Coverage or mutation scores.
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页码:65 / 65
页数:1
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