Subnanoscale Localization of Rare-Earth-Ion in Doped Crystal via Electromagnetically Induced Transparency

被引：0
|
作者：
Verma, Onkar N. [1 ]
Roy, Sourabh [1 ]
机构：
[1] Natl Inst Technol Warangal, Dept Phys, Warangal 506004, Telangana, India
来源：
2019 24TH MICROOPTICS CONFERENCE (MOC) | 2019年
关键词：
D O I：
10.23919/moc46630.2019.8982862
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present a subnanoscale localization of three-level.-type rare-rarth-ion doped in crystal via coupling it to a Gaussian probe beam and a Laguerre-Gaussian control beam in the dark state of electromagnetically induced transparency. This opens a possibility for coherent manipulation and spatial selection of individual solid qubits for quantum information science applications.
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收藏
页码：272 / 273
页数：2
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