Selenium in Dry Beans (Phaseolus vulgaris): A Neutron Activation Analysis approach

被引:0
|
作者
Kannan, S
Hamby, D
Green, B
Carlson, F
机构
[1] Univ Michigan, Ann Arbor, MI 48109 USA
[2] Oregon State Univ, Corvallis, OR 97331 USA
来源
FASEB JOURNAL | 2001年 / 15卷 / 05期
关键词
D O I
暂无
中图分类号
Q5 [生物化学]; Q7 [分子生物学];
学科分类号
071010 ; 081704 ;
摘要
引用
收藏
页码:A969 / A969
页数:1
相关论文
共 50 条
  • [1] Heirloom Dry Beans (Phaseolus vulgaris) in Northwest Washington
    Miles, Carol
    Atterberry, Kelly
    Brouwer, Brook
    HORTSCIENCE, 2015, 50 (09) : S197 - S197
  • [2] Volatile compounds of dry beans (Phaseolus vulgaris L.)
    Oomah, B. Dave
    Liang, Lisa S. Y.
    Balasubramanian, Parthiba
    PLANT FOODS FOR HUMAN NUTRITION, 2007, 62 (04) : 177 - 183
  • [4] THE NUTRITIONAL CONTRIBUTION OF DRY BEANS (PHASEOLUS-VULGARIS) IN PERSPECTIVE
    CARPENTER, KJ
    FOOD TECHNOLOGY, 1981, 35 (03) : 77 - 78
  • [5] Critical periods for weed control in dry beans (Phaseolus vulgaris)
    Burnside, OC
    Wiens, MJ
    Holder, BJ
    Weisberg, S
    Ristau, EA
    Johnson, MM
    Cameron, JH
    WEED SCIENCE, 1998, 46 (03) : 301 - 306
  • [6] Volatile Compounds of Dry Beans (Phaseolus vulgaris L.)
    B. Dave Oomah
    Lisa S. Y. Liang
    Parthiba Balasubramanian
    Plant Foods for Human Nutrition, 2007, 62
  • [7] GENETICS OF FLOWERING IN DRY BEANS (PHASEOLUS-VULGARIS L)
    LEYNA, HK
    COYNE, DP
    KORBAN, SS
    HORTSCIENCE, 1981, 16 (03) : 411 - 411
  • [8] Responses of dry beans (Phaseolus vulgaris L.) to sulfentrazone
    Hekmat, Sharareh
    Shropshire, Christy
    Soltani, Nader
    Sikkema, Peter H.
    CROP PROTECTION, 2007, 26 (04) : 525 - 529
  • [9] Production of Northwest Washington Heirloom Dry Beans (Phaseolus vulgaris)©
    Atterberry, Kelly Ann
    Miles, Carol A.
    Brouwer, Brook
    PROCEEDINGS OF THE 2014 ANNUAL MEETING OF THE INTERNATIONAL PLANT PROPAGATORS SOCIETY, 2015, 1085 : 341 - 341
  • [10] THE INHERITANCE OF TRYPTOPHAN CONCENTRATION IN DRY BEANS, PHASEOLUS-VULGARIS
    JOHNSON, LA
    SUMMERS, WL
    HORTSCIENCE, 1980, 15 (03) : 381 - 381