Characterization of a charge-coupled-device detector in the 1100-0.14-nm (1-eV to 9-keV) spectral region

被引:56
|
作者
Poletto, L [1 ]
Boscolo, A [1 ]
Tondello, G [1 ]
机构
[1] Univ Padua, Ist Nazl Fis Mat, Dept Elect & Informat, I-35131 Padua, Italy
关键词
D O I
10.1364/AO.38.000029
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The performances of a CCD detector have been evaluated in a wide spectral region, which ranges from the near IR to the soft x ray. Four different experimental setups have been used: a Czerny-Turner monochromator for the 1100-250-nm region, a normal-incidence Johnson-Onaka monochromator for the 250-30-nm region, a grazing-incidence Rowland monochromator for the 30-0.27-nm region, and a test facility with broadband filters for the 0.27-0.14-nm region. The CCD is thinned and backilluminated, with a 512 x 512 format and 24 mu m X 24 mu m pixels. The quantum efficiency was measured in the 1100-0.14-nm (1-eV to 9-keV) region, and the uniformity of response was in the 1100-58-nm (1-21-eV) region. Contamination effects in the vacuum UV range are also discussed. (C) 1999 Optical Society of America.
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页码:29 / 36
页数:8
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