Efficient and robust analysis of complex scattering data under noise in microwave resonators

被引：198
|
作者：
Probst, S. [1 ]
Song, F. B. [1 ,2 ]
Bushev, P. A. [3 ]
Ustinov, A. V. [1 ,4 ]
Weides, M. [1 ,5 ]
机构：
[1] Karlsruhe Inst Technol, Inst Phys, D-76128 Karlsruhe, Germany
[2] Chinese Elect Technol Corp, Inst 10, Chengdu 610036, Peoples R China
[3] Univ Saarland, Expt Phys, D-66123 Saarbrucken, Germany
[4] Natl Univ Sci & Technol MISIS, Lab Superconducting Metamat, Moscow 119049, Russia
[5] Johannes Gutenberg Univ Mainz, Inst Phys, D-55099 Mainz, Germany
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2015年 / 86卷 / 02期
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
10.1063/1.4907935
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Superconducting microwave resonators are reliable circuits widely used for detection and as test devices for material research. A reliable determination of their external and internal quality factors is crucial for many modern applications, which either require fast measurements or operate in the single photon regime with small signal to noise ratios. Here, we use the circle fit technique with diameter correction and provide a step by step guide for implementing an algorithm for robust fitting and calibration of complex resonator scattering data in the presence of noise. The speedup and robustness of the analysis are achieved by employing an algebraic rather than an iterative fit technique for the resonance circle. (C) 2015 AIP Publishing LLC.
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页数：6
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