Ultra-thin TaN Films for Superconducting Nanowire Single-Photon Detectors

被引:29
|
作者
Il'in, K. [1 ]
Hofherr, M. [1 ]
Rall, D. [1 ]
Siegel, M. [1 ]
Semenov, A. [2 ]
Engel, A. [3 ]
Inderbitzin, K. [3 ]
Aeschbacher, A. [3 ]
Schilling, A. [3 ]
机构
[1] Karlsruher Inst Technol, Inst Mikro & Nanoelekt Syst, D-76187 Karlsruhe, Germany
[2] DLR Inst Planetary Res, D-12489 Berlin, Germany
[3] Univ Zurich, Inst Phys, CH-8057 Zurich, Switzerland
关键词
TaN; Superconducting thin films; Superconducting detectors;
D O I
10.1007/s10909-011-0424-3
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ultra-thin films of superconducting tantalum nitride are deposited by reactive magnetron sputtering on heated sapphire substrates. The critical temperature T (C)=10.25 K is reached for films thicker than 10 nm. A superconducting nanowire single-photon detector in the form of a meander line with a width of 110 nm was made from 5 nm thick TaN film. The detector had a transition temperature of 8.3 K and a critical current density of 4 MA/cm(2) at 4.2 K. A photon detection efficiency of 20% has been obtained for the detector with a filling factor of 0.55 at wavelengths up to 700 nm.
引用
收藏
页码:809 / 814
页数:6
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