A Degradation Model of Aluminum Electrolytic Capacitors for LED Drivers

被引：0
|
作者：
Sun, Bo [1 ,5 ]
Fan, Xuejun [2 ,5 ]
Yuan, C. A. [3 ,5 ]
Qian, Cheng [3 ,5 ]
Zhang, Guoqi [3 ,4 ,5 ]
机构：
[1] Delft Univ Technol, Beijing Res Ctr, Beijing, Peoples R China
[2] Lamar Univ, Beaumont, TX 77710 USA
[3] Chinese Acad Sci, Inst Semicond, Beijing, Peoples R China
[4] Delft Univ Technol, DIMES Ctr SSL Technol, Delft, Netherlands
[5] State Key Lab Solid State Lighting, Changzhou, Jiangsu, Peoples R China
来源：
2015 16TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME) | 2015年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The failure of aluminum electrolytic capacitors is considered as one of major failure modes of the LED drivers. This paper propose a degradation model of aluminum electrolytic capacitors considers impacts of operation time and temperature.
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页数：4
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