Far field measurement using near field magnetic probing method

被引：0
|
作者：
Subramanya, Bala P. [1 ]
Sharma, Deepak [1 ]
机构：
[1] Intel Technol India Pvt Ltd, Client Comp Grp, Bangalore, Karnataka, India
来源：
2016 14TH INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC INTERFERENCE & COMPATIBILITY (INCEMIC-2016) | 2016年
关键词：
FFA; Far field approximation; Near field scanning; magnetic probing; Radiated Emission debug;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
a cost effective complementary tool to identify and debug the complex emission issues using far field approximation method is demonstrated. 3 Meter chamber data and FFA Measurement data are compared to evaluate FFA method and its benefits. Though the complete evaluation FFA is work in progress, the initial measurement data shows that the FFA method can help in predicting far field emission using near field scan.
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页数：2
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