X-ray Diffraction Analysis of Cu2+ Doped Zn1-xCuxFe2O4 Spinel Nanoparticles using Williamson-Hall Plot Method

被引:29
|
作者
Kumar, Dinesh [1 ]
Kumar, Abhishek [2 ,3 ]
Prakash, Rajiv [1 ]
Singh, Akhilesh Kumar [1 ]
机构
[1] Banaras Hindu Univ, Indian Inst Technol, Sch Mat Sci & Technol, Varanasi 221005, Uttar Pradesh, India
[2] Banaras Hindu Univ, Indian Inst Technol, Cent Instrumental Facil Ctr, Varanasi 221005, Uttar Pradesh, India
[3] Univ Delhi, Acharya Narendra Dev Coll, New Delhi 110019, India
来源
关键词
Spinel; X-ray diffraction; Rietveld refinement; Williamson-Hall plot; Nanoparticle; MAGNETIC-PROPERTIES;
D O I
10.1063/1.5122410
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The nanoparticles (NPs) of Zn1-xCuxFe2O4 (ZCFO) spinels with x = 0, 0.2, 0.4, 0.6 and 0.8 were synthesized by a sol-gel combustion method using acetate precursor. The synthesized NPs of ZCFO were characterized by X-ray diffraction (XRD) analysis using Rietveld structure refinement. The Rietveld refinement of the XRD patterns revealed that the ZCFO spinels crystallize into diamond cubic structure with Fd (3) over barm space group. The lattice constant and unit cell volume for ZCFO NPs shrink with enhancing doping concentration of Cu2+ ion. The crystalline growth in the NPs of ZCFO was examined by peak broadening present in the XRD pattern. The Williamson-Hall (W-H) plot method was used to study the individual role of crystallite sizes and lattice strain on the peak broadening of the NPs of ZCFO spinels. High-resolution scanning electron microscopy was also done to confirm the particle size.
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页数:5
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