An attempt was made to understand the spectral interference of Gd on 29 common analytes (Ag, Al, B,Ba, Bi, Ca, Cd, Ce, Co, Cr, Cu, Dy, Fe, Ga, Gd, In, La, Li, Lu, Mg, Mn, Na, Nd, Ni, Pb, Pr, Sr, Tl, and Zn) using inductively coupled plasma atomic emission spectrometry (ICP-AES) with a capacitive charge-coupled device (CCD) as the detector. The present study includes identification of suitable interference-free analytical lines of these analytes, evaluation of the correction factor of each analytical line, and determination of the tolerance levels of these analytical lines along with the ICP-AES-based methodology for the simultaneous determination of Gd. Based on the spectral interference study, an ICP-AES-based method was developed for the determination of these analytes at trace levels in the presence of a Gd matrix without chemical separation. Furthermore, the developed methodology was validated using synthetic samples prepared from commercially available standard reference material solutions of individual elements; the results were found to be satisfactory. The method was also compared with other techniques.